Optical Interference Film Thickness Measurement Device 'Model 3100'
An industry-standard machine boasting a large number of delivery achievements! Equipped with linear array photodetectors.
The "Model3100" is an optical interference film thickness measurement device that employs linear array elements in the light-receiving sensor, enabling high-speed measurements. By standardly equipping spectral analysis software, it allows for simultaneous measurement of multilayer films (typically up to three layers) and the measurement of optical constants (n, k). It enables fine parameter settings suitable for various film characteristics, allowing for more diverse film thickness measurements of various film structures. 【Features】 ■ Capable of measuring up to 70μm equivalent to an oxide film with a high-sensitivity, high-resolution head (optional) ■ A 100x lens (with a micro spot of φ0.75μm) is also available ■ Easy implementation of program settings for special film measurements suitable for the process ■ Supports various applications (magnetic heads, FPD, material research, etc.) and allows for the creation of sample stages tailored to specific uses (optional) *For more details, please refer to the PDF materials or feel free to contact us.
- Company：アークステーション
- Price：Other
